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Categories | Scanning Microscope |
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Brand Name: | CNOEC, OPTO-EDU |
Model Number: | A63.7088 |
Certification: | CE, Rohs |
Place of Origin: | China |
MOQ: | 1 pc |
Price: | FOB $1~1000, Depend on Order Quantity |
Payment Terms: | T/T, West Union, Paypal |
Supply Ability: | 5000 pcs/ Month |
Delivery Time: | 5~20 Days |
Packaging Details: | Carton Packing, For Export Transportation |
Resolution: | 1.0nm@30KV(SE), 1.5nm@1KV(SE) |
Magnification: | 1x~2000000x |
Electron Gun: | Schottky Field Emission Gun |
Voltage: | Accelerating Voltage 0.02~30KV |
Electron Beam: | 1pA~20nA |
Vacuum System: | 1 Sputter Ion Pump, 1 Turbo Molecular Pump, 1 Mechanical Pump |
Company Info. |
Opto-Edu (Beijing) Co., Ltd. |
Verified Supplier |
View Contact Details |
Product List |
A63.7088 | |
Resolution | 1.0nm@30KV(SE), 1.5nm@1KV(SE) |
Magnification | 1x~2000000x |
Electron Gun | Schottky Field Emission Gun |
Voltage | Accelerating Voltage 0.02~30KV |
Electron Beam | 1pA~20nA |
Vacuum System | 1 Sputter Ion Pump, 1 Turbo Molecular Pump, 1 Mechanical Pump |
Detector | SE in Lens, SE in Sample Room, BSE, CCD |
Extend Port | Extend Ports On Sample Room For BSE, EDS, EBSD, CL etc. |
Specimen Stage | 5 Axes Auto Stage, Travel Range: X=125mm, Y=125mm, Z=50mm, R=360°, T=-5°~+70° |
Max Specimen | Specimen Room Dia.330mm, Height 260mm |
Image System | Real Still Image Max Resolution 256x256~16k~16k Pixels |
Computer & Software | PC Work Station Windows System, With Professional Image Analysis Software To Fully Control Whole SEM Microscope Operation, Mouse, Keyboard |
Control Panel | Included |
Dimension & Weight | Main Body 1900x1100x1800mm, Total Weight 800Kg |
Optional Accessories | |
A50.7091 | Ion Beam Cleaner |
A50.7092 | Field Emission Gun Lamp |
▶ Superior Electron-optics Design ● Thermal field emission electron gun, stable beam, high imaging resolution ● Full tube acceleration technology ensures high imaging performance of electron beam at low acceleration voltage ● Composite lens design of electrostatic lens and magnetic lens, the objective lens has no magnetic leakage, and the imaging of magnetic samples is worry-free |
▶ Comprehensive Signal Collection System ● Can simultaneously collect signals from two types of secondary electrons, backscattered electrons and transmitted electrons. ● The sample morphology and composition contrast are displayed simultaneously to reveal the sample's microscopic morphology and composition information to the greatest extent. |
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